2012
DOI: 10.1680/emr.11.00002
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Ambient erbium luminescence in silicon and silicon-germanium films

Abstract: Prior studies have shown that photoluminescence from Er3+ impurities in silicon is severely limited at room temperature by non-radiative relaxation and solid solubility, and room temperature emission from Er3+ in oxide-based hosts becomes diminished at high erbium concentrations. This work presents studies of thin films (0·2 µm thick) prepared by vacuum co-evaporation from elemental sources (erbium, silicon and silicon/germanium) followed by vacuum annealing (600°C); materials of this type, which are produced … Show more

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Cited by 4 publications
(3 citation statements)
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“…As was explained earlier, the 4f transitions possess some immunity from the host material and the overall symmetry, although the dominant peaks or preferred recombination transitions can vary. As a manifestation to this fact, we would like to bring the attention to the fact that the samples in this work were processed using sol-gel techniques, and that the transitions indicated on page 238 of reference [41] were for Er-doped aluminosilicate, while the ones in the work of Abedrabbo et al in references [42,43] were for ion beam mixing of Er, Si and O and for Er, Si, O and Ge, and all of them shared similar transitions. The ion beam mixing effort of this group started earlier without Er impurity centers as in references [44,45] and was consolidated with rare-earth inclusions.…”
Section: Erbium Emission At the 4f Transition Bandmentioning
confidence: 99%
“…As was explained earlier, the 4f transitions possess some immunity from the host material and the overall symmetry, although the dominant peaks or preferred recombination transitions can vary. As a manifestation to this fact, we would like to bring the attention to the fact that the samples in this work were processed using sol-gel techniques, and that the transitions indicated on page 238 of reference [41] were for Er-doped aluminosilicate, while the ones in the work of Abedrabbo et al in references [42,43] were for ion beam mixing of Er, Si and O and for Er, Si, O and Ge, and all of them shared similar transitions. The ion beam mixing effort of this group started earlier without Er impurity centers as in references [44,45] and was consolidated with rare-earth inclusions.…”
Section: Erbium Emission At the 4f Transition Bandmentioning
confidence: 99%
“…In this study, gadolinium and iron were used as the implanted material. As a matter of fact, in addition to directly implanting Gd into ZnO as in this work, members of this group have been keeping a track record of ion-beam mixing coated samples to modify the bandgap of semiconductors as in refs ( 30 ) and ( 31 ) and to create structures with optically active impurity centers as in refs ( 32 ) and ( 33 ) via energetically accelerated inert gases.…”
Section: Introductionmentioning
confidence: 99%
“…Irradiation also allows for the investigation of fundamental semiconductor properties under extreme conditions in space applications. The group involved in this study has a long history of using irradiation as a technique, having previously performed ion-beam mixing to process modulated bandgap structures and surface modification of Si-substrates to introduce optically active impurities [23,24]. In the present work, we aim to demonstrate the alteration of optical properties in semiconductors through the transmutation of dopant constituents.…”
Section: Introductionmentioning
confidence: 99%