2016
DOI: 10.1039/c6ra09731f
|View full text |Cite
|
Sign up to set email alerts
|

Ammonium ion detection in solution using vertically grown ZnO nanorod based field-effect transistor

Abstract: Vertically aligned ZnO nanorods based fabricated FET providing a well-defined large surface area for ammonium ion detection in solution.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

2
24
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
7
1
1

Relationship

1
8

Authors

Journals

citations
Cited by 68 publications
(26 citation statements)
references
References 39 publications
2
24
0
Order By: Relevance
“…[7][8][9][10][11] Therefore, they have been applied in ultraviolet photodetectors, [12][13][14][15][16] eld electron emission displays, 17 and eld effect transistors (FETs). [18][19][20] Hydrothermally grown ZnO nanorods have been used in FETs because of their low temperature growth, tunable growth behavior, and electrical property. 21,22 However, generally, ZnO nanorod FETs exhibit the problem of low on-current, which affects their practical applications.…”
Section: Introductionmentioning
confidence: 99%
“…[7][8][9][10][11] Therefore, they have been applied in ultraviolet photodetectors, [12][13][14][15][16] eld electron emission displays, 17 and eld effect transistors (FETs). [18][19][20] Hydrothermally grown ZnO nanorods have been used in FETs because of their low temperature growth, tunable growth behavior, and electrical property. 21,22 However, generally, ZnO nanorod FETs exhibit the problem of low on-current, which affects their practical applications.…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, their application in devices, such as field-effect transistors, 19,20 ultraviolet (UV) photosensors, 21,22 UV light-emitting diodes, 23 glucose sensors, 24,25 varistors, 26 gas sensors, 27 laser diodes, 28 surface acoustic wave (SAW) devices, 29 solar cells, 30,31 memory devices, 32,33 and field emission (FE) devices, 34 is promising. In recent years, FE devices have gained widespread attention for their application in flat-panel displays and other electronic devices, such as microwave amplifiers, high-brightness electron-source X-ray tubes, cathode-ray tube monitors, and electron microscopes.…”
mentioning
confidence: 99%
“…S1(f) shows the lattice spacing measurements for dark and white regions as 2.32 Å, and 2.5 Å, respectively which confirm the presence of Au (111) and CuO (002). Bright field TEM image of CuO NWs has been shown in [40][41][42] . The XPS of Cu 2p core level is expressed in Fig.…”
Section: Resultsmentioning
confidence: 99%