Amorphous silica studied by high energy X-ray diffraction

Poulsen, Henning Friis; Neuefeind, J.; Neumann, H.; Schneider, J. R.; Zeidler, Manfred

doi:10.1016/0022-3093(95)00095-x

Cited by 251 publications

(224 citation statements)

References 18 publications

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“…Raw data were corrected for detector dead time, polarization, absorption, and variation in detector solid angle. 14 The scattering intensity measured in arbitrary units was converted into the coherent scattering intensity per atom in electronic units using the Krogh-Moe-Norman method. 15,16 Compton scattering was corrected using the values given by Cromer and Mann.…”

Section: ͔͒mentioning

confidence: 99%

Radiation-modified structure of Ge25Sb15S60 and Ge35Sb5S60 glasses

Kavetskyy¹,

Shpotyuk²,

Kaban³

et al. 2008

The Journal of Chemical Physics

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Atomic structures of Ge 25 Sb 15 S 60 and Ge 35 Sb 5 S 60 glasses are investigated in the ␥-irradiated and annealed after ␥-irradiation states by means of high-energy synchrotron x-ray diffraction technique. The first sharp diffraction peak ͑FSDP͒ is detected at around 1.1 Å −1 in the structure factors of both alloys studied. The FSDP position is found to be stable for radiation/annealing treatment of the samples, while the FSDP intensity shows some changes between ␥-irradiated and annealed states. The peaks in the pair distribution functions observed between 2 and 4 Å are related to the Ge-S, Ge-Sb, and Sb-Sb first neighbor correlations and Ge-Ge second neighbor correlations in the edge-shared GeS 4/2 tetrahedra, and S-S and/or Ge-Ge second neighbor correlations in the corner-shared GeS 4/2 tetrahedra. Three mechanisms of the radiation-/annealing-induced changes are discussed in the framework of coordination topological defect formation and bond-free solid angle concepts.

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Section: ͔͒mentioning

confidence: 99%

Radiation-modified structure of Ge25Sb15S60 and Ge35Sb5S60 glasses

Kavetskyy¹,

Shpotyuk²,

Kaban³

et al. 2008

The Journal of Chemical Physics

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“…Due to the small scattering angles, the polarization correction is almost negligible. 36 The diffraction experiments were carried out in the Debye-Scherrer geometry. The layout of the experimental setup is shown in Fig.…”

Section: Introductionmentioning

confidence: 99%

Strain distribution in Zr64.13Cu15.75Ni10.12Al10 bulk metallic glass investigated by in situ tensile tests under synchrotron radiation

Stoica

Das

Bednarčı́k

et al. 2008

Journal of Applied Physics

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We report on the evolution of the atomic-scale strain tensor of ductile Zr64.13Cu15.75Ni10.12Al10 bulk metallic glass under tensile loading by using x-ray synchrotron radiation. The same kind of samples was previously investigated under compressive loading and revealed yielding at 1690 MPa together with large deformability of up to 160% strain. In tension the samples fracture at a lower stress, 1500 MPa, with no sign of yielding or plastic deformation. With no macroplasticity observed under tension, large differences in the elastic constants obtained from the strain tensor and from ultrasonic sound velocity measurements are revealed. This paper presents in detail the measuring procedure as well as the calculation of the tensile tensor and pair distribution functions of Zr64.13Cu15.75Ni10.12Al10 at different stages of deformation. The results are discussed in comparison with other reported data obtained from x-ray diffraction measurements using synchrotron radiation.

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“…Scattered intensity was measured between 0.5 and 1 Е 19  . Raw data were corrected for detector dead-time, polarization, absorption and variation in detector solid angle [13]. The scattering intensity was converted into the coherent scattering intensity per atom in electronic units by using the Krogh-Moe-Norman method [14,15].…”

Section: Methodsmentioning

confidence: 99%

Radiation/annealing-induced structural changes in GexAs40-xS60 glasses as revealed from high-energy synchrotron X-ray diffraction measurements

Kavetskyy¹

2012

Semicond. Phys. Quantum Electron. Optoelectron.

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Abstract. Local atomic structure of Ge x As 40x S 60 glasses (x = 16, 24, 32, and 36) has been investigated in the -irradiated (2.41 MGy dose) and annealed after -irradiation states by using the high-energy synchrotron X-ray diffraction technique. The accumulated dose of 2.41 MGy is chosen to be close to the known in literature focal point (2.0 MGy) for the system tested, at which the -irradiation-induced optical (darkening) effect does not depend on the composition. It is established that the first sharp diffraction peak (FSDP) is located at around 1 Е 1 . 1  in the structure factors S(Q) of all the alloys studied. The FSDP position is found to be constant on radiation/annealing treatment, but the intensity of the FSDP reveals changes under irradiation/annealing only for the compositions with x = 16 and 24. The radiation/annealing-induced changes are also observed on the pair distribution functions in the first and second coordination shells for these compounds. Practically invisible effects on the FSDP and pair distribution functions are found for the alloys with x = 32 and 36. The radiation/annealing-induced structural changes detected mainly in the S As  sub-system of the glasses examined are well explainable within the Tanaka approach for interpretation of the photo-induced structural changes and related phenomena in As 2 S 3 chalcogenide glass and similar materials.

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Amorphous silica studied by high energy X-ray diffraction

Cited by 251 publications

References 18 publications

Radiation-modified structure of Ge25Sb15S60 and Ge35Sb5S60 glasses

Radiation-modified structure of Ge25Sb15S60 and Ge35Sb5S60 glasses

Strain distribution in Zr64.13Cu15.75Ni10.12Al10 bulk metallic glass investigated by in situ tensile tests under synchrotron radiation

Radiation/annealing-induced structural changes in GexAs40-xS60 glasses as revealed from high-energy synchrotron X-ray diffraction measurements

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