1975
DOI: 10.1107/s0567739475000769
|View full text |Cite
|
Sign up to set email alerts
|

An absolute measurement of the lattice parameter of germanium using multiple-beam X-ray diffractometry

Abstract: The d spacing of the 355 reflexion in silicon has been compared with the d spacing of the 800 reflexion in germanium using pseudo non-dispersive multiple-beam X-ray diffractometry with Mo Kal radiation. This technique gives the ratio of the two lattice parameters without the need for a precise knowledge of the X-ray wavelength. Symmetric transmission geometry was used to eliminate the refractive index correction. The results were: d(800 Ge) _ 1.0002348 (+ 0.0000006) at 22.5 °C d(355 Si) and d(800 Ge) _ 1.00024… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

6
18
0

Year Published

1976
1976
2021
2021

Publication Types

Select...
9

Relationship

0
9

Authors

Journals

citations
Cited by 91 publications
(24 citation statements)
references
References 6 publications
6
18
0
Order By: Relevance
“…Spinpolarization was not energetically favourable in this structure which agrees with the Pauli paramagnetic character measured [5]. This can be rationalized by the (2) 3.8338 (2) 3.8286 (2) 3.8248(2) c (Å ) 13.6083 (7) 13.5602 (7) 13.5532 (6) quite small anti-bonding Ni-Ni interactions at the Fermi level.…”
Section: Tlni 2 Sesupporting
confidence: 78%
See 1 more Smart Citation
“…Spinpolarization was not energetically favourable in this structure which agrees with the Pauli paramagnetic character measured [5]. This can be rationalized by the (2) 3.8338 (2) 3.8286 (2) 3.8248(2) c (Å ) 13.6083 (7) 13.5602 (7) 13.5532 (6) quite small anti-bonding Ni-Ni interactions at the Fermi level.…”
Section: Tlni 2 Sesupporting
confidence: 78%
“…All the samples were characterised by X-ray diffraction using a Guinier-Ha¨gg camera (CuKa 1 ) and germanium ða ¼ 5:6570805ÅÞ [13] or silicon ða ¼ 5:431028ÅÞ [14] as internal standard. The powders were also studied with neutron diffraction at Studsvik, Sweden (NPD, l ¼ 1:471Å) in the temperature range 10-300 K. The refinements of the diffraction data were made with the Rietveld method using the FullProf program [15].…”
Section: Diffractionmentioning
confidence: 99%
“…The optimized lattice constant is 0.5776 nm, close to the experimental value of 0.5658 nm [36]. Along the [111] direction, 9 bilayers are used to build the slab, with 1.473 nm of vacuum.…”
Section: Surface Energy Of Ge(111) the Configuration Of The Valence mentioning
confidence: 99%
“…(16). The lattice parameters for silicon and germanium at 22.5 C are a Si ¼ 5.4310 Å (Mohr et al, 2012) and a Ge ¼ 5.6578 Å (Baker and Hart, 1975), respectively. For the atomic form factor calculations, the fits of Waasmaier and Kirfel (1995) have been applied.…”
Section: -mentioning
confidence: 99%