2021
DOI: 10.1016/j.precisioneng.2020.09.007
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An absolute surface encoder with a planar scale grating of variable periods

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Cited by 19 publications
(9 citation statements)
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“…With the fringe density relative error of 0.001, the relative errors of the grating groove density coefficients can be controlled in the order of 10 -8 and 10 -6 , respectively. |rbe|<40μm, and R. P. is still larger than 3.7×10 4 . ξth=0.001 can meet the demands of grating groove density, aberration correction ability and resolving power.…”
Section: Impacts Of the Fringe Density Errormentioning
confidence: 90%
See 1 more Smart Citation
“…With the fringe density relative error of 0.001, the relative errors of the grating groove density coefficients can be controlled in the order of 10 -8 and 10 -6 , respectively. |rbe|<40μm, and R. P. is still larger than 3.7×10 4 . ξth=0.001 can meet the demands of grating groove density, aberration correction ability and resolving power.…”
Section: Impacts Of the Fringe Density Errormentioning
confidence: 90%
“…The efficiency and resolving power of instruments can be improved. VLS plane gratings are widely used as key components in extreme ultraviolet spectrum analysis, monochromators, spectral imaging, laser focusing and position sensors [1][2][3][4] .…”
Section: Introductionmentioning
confidence: 99%
“…Both types can be fabricated by mechanical diamond cutting or laser interference lithography techniques [ 6 , 7 , 8 , 9 ]. Recently, the demand for absolute-type optical encoders is increasing, in which a VLS grating serves as a scale for position measurement [ 1 , 10 , 11 ]. With the employment of a planar VLS grating having grating pattern structures along the two orthogonal directions, in-plane absolute position measurement can be achieved [ 10 ].…”
Section: Introductionmentioning
confidence: 99%
“…Recently, the demand for absolute-type optical encoders is increasing, in which a VLS grating serves as a scale for position measurement [ 1 , 10 , 11 ]. With the employment of a planar VLS grating having grating pattern structures along the two orthogonal directions, in-plane absolute position measurement can be achieved [ 10 ]. However, instabilities in the mechanical manufacturing process or any distortion and imperfect wavefront control in the lithography process can result in unwanted pitch deviation of the planar VLS grating [ 12 , 13 ], which can influence its performance as the scale for two-dimensional absolute position measurement.…”
Section: Introductionmentioning
confidence: 99%
“…The measurement accuracy is based on the grating pitch used, and the production and processing technology of the grating is related to the manufacturing process of the grating [28][29][30][31], which is less affected by the environment, and has a relatively large advantage in the realization of six-degree-of-freedom measurement. At present, the grating encoder is developing in the direction of absolute type, multiple degrees of freedom, real-time measurement and large range [32][33][34][35].…”
Section: Introductionmentioning
confidence: 99%