An accurate modeling method utilizing application-specific statistical information and its application to SRAM yield estimation

An analytical model for performance yield of nanoscale SRAM accounting for the sense amplifier strobe signal

“…Delay of the AND for the global done signal t done-G is significant but still 33% faster than t strobe or t trig . (11) …”

“…While other papers look at functional yield [10][11], this paper considers how to model the performance yield of dies that are operational as a function of the strobe timing. SRAM read delay is dominated by the development of a differential voltage on the bit lines.…”

“…We then simply find the column with the maximum delay (the order statistic of the worst SA/I READ combination, for i=1, for a word of w bits) using Equation11 and integrate to find the performance yield:…”