“…The same problem appears, when the sample is a thin film on a substrate and in many other cases. A number of analytical and numerical algorithms were put forward to extend the KK method to off-normal reflection 9,10,11,12,13,14,15 , transmission 16,17,18,19 , attenuated total reflection (ATR) spectra 13,20,21,22 as well as to optical data on layered samples 14,17,23,24,25,26,27 and lowsymmetry crystals 28,29 and other 'non-standard' situations. Although the proposed techniques, taken together, certainly cover a substantial scope of applications, it is desirable, from the practical point of view, to have a single universal approach, which can be used in most of the currently used and future optical experiments without major readaptation.…”