An AHP-Based Defect Detection Algorithm Study for E-paper Pockmarks Detection

Sun, Quanjun; Huang, Zucheng; Yuan, Hai; Wang, Weijun; Wang, Jian; Jiang, Xuyao; Xu, Zheng; Sun, Quanshuo; Liu, Zhenjia

doi:10.1109/icaidt62617.2024.00055

2024 International Conference on Artificial Intelligence and Digital Technology (ICAIDT) 2024

DOI: 10.1109/icaidt62617.2024.00055

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An AHP-Based Defect Detection Algorithm Study for E-paper Pockmarks Detection

Quanjun Sun,

Zucheng Huang,

Hai Yuan

et al.

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An AHP-Based Defect Detection Algorithm Study for E-paper Pockmarks Detection

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References 6 publications

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