Proceedings of the 16th International Software Product Line Conference - Volume 1 2012
DOI: 10.1145/2362536.2362547
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An algorithm for generating t-wise covering arrays from large feature models

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Cited by 191 publications
(138 citation statements)
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“…Running all the test cases in an existing test suite can results in a large amount of effort or even become infeasible due to deadlines and cost constraints. It may take few days to complete the test configuration generation on an SPL using CIT even with low (2 or 3) twise covering array (Johansen et al, 2012a). To tackle this, Combinatorial Interaction Testing techniques that employ systematic selection, objective prioritization, or combination of both have been proposed by many and are still an active research area.…”
Section: Test Selection and Prioritizationmentioning
confidence: 99%
See 1 more Smart Citation
“…Running all the test cases in an existing test suite can results in a large amount of effort or even become infeasible due to deadlines and cost constraints. It may take few days to complete the test configuration generation on an SPL using CIT even with low (2 or 3) twise covering array (Johansen et al, 2012a). To tackle this, Combinatorial Interaction Testing techniques that employ systematic selection, objective prioritization, or combination of both have been proposed by many and are still an active research area.…”
Section: Test Selection and Prioritizationmentioning
confidence: 99%
“…One of the main strengths of CIT is that it enables a significant reduction of the number of test cases without compromising functional coverage. Similarly, in SPL, several works have been reported that apply and evaluate the effectiveness of CIT to reduce the testing effort by selecting a set of representative products (Johansen et al, 2012a;2012d;Galindo et al, 2014). This paper is structured as follows; in section 2, the details on the systematic mapping process are presented, which includes definition of the research questions, conducting the search process, filtering the evidences based on selection criteria and extracting particulars from selected primary studies into different categorizations.…”
Section: Introductionmentioning
confidence: 99%
“…Second, the t-wise covering array must be generated. We have developed an algorithm that can generate such arrays from large features models [3] 3 . These products must then be generated or physically built.…”
Section: Reusable Component Testingmentioning
confidence: 99%
“…Combinatorial interaction testing is to first construct a small set of products, called a covering array, in which interaction faults are most likely to show up and then to test these products normally. We have previously advanced this approach by showing that generating covering arrays from realistic features models is tractable [2] and by providing an algorithm that allows generating covering arrays for product lines of the size and complexity found in industry [3].…”
Section: Introductionmentioning
confidence: 99%
“…When the number of products is too large, testing all the products is unfeasible. This could be addressed by using, e.g., sample-based SPL testing techniques [21,20,27,23], where a subset of products-covering relevant combinations of features-is generated and tested by applying single system testing techniques.…”
Section: Introductionmentioning
confidence: 99%