IEEE Antennas and Propagation Society International Symposium. 1999 Digest. Held in Conjunction With: USNC/URSI National Radio
DOI: 10.1109/aps.1999.789511
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An analysis of a dual gridded reflector antenna

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Cited by 2 publications
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“…The conventional approach for analyzing a DGR includes using physical optics (PO) for rear and front shells, geometric optics (GO) for transmission through grids, and denser PO integration grids for interactions between two shells, in the near fields of each other, up to a certain orders of interactions [4]. Since PO is not suitable for analyzing dielectric materials [12], [13], the impact of intercostal elements could not be ascertained, and therefore a certain loss budget, based on the past experience, is generally taken to account for the same.…”
Section: Analysis Of Dgr Assemblymentioning
confidence: 99%
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“…The conventional approach for analyzing a DGR includes using physical optics (PO) for rear and front shells, geometric optics (GO) for transmission through grids, and denser PO integration grids for interactions between two shells, in the near fields of each other, up to a certain orders of interactions [4]. Since PO is not suitable for analyzing dielectric materials [12], [13], the impact of intercostal elements could not be ascertained, and therefore a certain loss budget, based on the past experience, is generally taken to account for the same.…”
Section: Analysis Of Dgr Assemblymentioning
confidence: 99%
“…Different antenna technologies including shaped reflectors, polarization filtering, aperture sharing, etc., are simultaneously utilized in designing a DGR antenna system. Although aspects like reflector shaping [1]- [3], basic steps in electromagnetic analysis of DGR antenna [4], [5], and scattering from strip grids [6], [7] have been reported, minimal exposure has been given to RF impact analysis of intercostal structure (IC structure) [8], [9], wherein simple configurations consisting of only IC ring and stiffener posts are analyzed. In this letter, we present an efficient method of modeling a detailed dielectric IC structure and its impact analysis using method of moments (MoM) in conjunction with physical optics (PO) for conducting elements.…”
Section: Introductionmentioning
confidence: 99%