An Analysis of Reliable FDTD using OGT and Effective Permittivity Boundary Solution for Yee's Cell Structures

Min, Kyeong‐Sik; Vu, Manh-Dat

doi:10.1109/apmc.2007.4554598

2007 Asia-Pacific Microwave Conference 2007

DOI: 10.1109/apmc.2007.4554598

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An Analysis of Reliable FDTD using OGT and Effective Permittivity Boundary Solution for Yee's Cell Structures

Kyeong‐Sik Min

Manh-Dat Vu

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An Analysis of Reliable FDTD using OGT and Effective Permittivity Boundary Solution for Yee's Cell Structures

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References 8 publications

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