The downscaling of conventional MOSFETs has come to its fundamental limits. TFETs are very attractive devices for low power applications because of their low off-current and potential for smaller sub threshold slope. In this paper, the impact of various parameter variations on the performance of a DG-PNIN Tunnel field effect transistor is investigated. In this work, variations in gate oxide material, source doping, channel doping, drain doping, pocket doping and body thickness are studied and all these parameters are optimized as performance boosters to give better current characteristics parameters. After optimization with all these performance boosters, the device has shown improved performance with increased on-current and reduced threshold voltage and the I on /I off ratio is > 10 6 .