An anti-spot, high-precision subdivision algorithm for linear CCD based single-track absolute encoder

Yuan, Ping; Huang, Daqing; Lei, Zhongkui; Xu, Cheng

doi:10.1016/j.measurement.2019.01.050

Cited by 20 publications

(8 citation statements)

References 19 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The results of the adhesive surface roughness measurement. disc manufacturing process not only for surface quality control but also, in combination with high-precision algorithms, similar as described in [25] for the determination of the angular position of the encoder grating. Furthermore, it can be used for the surface parameter and imperfection analysis of other textured objects, as the approach offers a rapid, often preliminary evaluation when this is required.…”

Section: Discussionmentioning

confidence: 99%

Measurement and determination of encoder disc surface parameters in x-z planes using a conventional optical disc reading head

et al. 2020

View full text Add to dashboard Cite

Non-contact surface measurement methods as well as roughness parameter determination methods are analyzed in the paper. While most of the modern non-contact surface inspection methods require advanced instrumentation and a big budget, this study looks into a novel approach to non-contact encoder disc roughness measurements by using the proposed system attached to the rotary table with an implemented optical disc pick up head and the reference angle encoder. Application of a conventional optical disc laser reading system resulted in a cost effective and compact solution for a nondestructive angle encoder disc surface inspection. Assets and shortcomings as well as detailed analysis of the measurement procedure are explained in the paper. The experimental setup and the measurement results are presented within this article.

show abstract

Section: Discussionmentioning

confidence: 99%

Measurement and determination of encoder disc surface parameters in x-z planes using a conventional optical disc reading head

et al. 2020

View full text Add to dashboard Cite

show abstract

“…According to the available literature, the anti-stain algorithms of IDM mainly include literature [19], [20] and [21]. For comparison, we compare the algorithms in three literatures with the algorithms proposed.…”

Section: E Comparative Analysismentioning

confidence: 99%

“…This effectively supports the identification of stains and the realization of anti-stain properties in photoelectric displacement measurement. In 2019, Yuan [19] proposed a high-precision subdivision algorithm with robust performance, which exhibited a precision of 1.6" and achieved anti-interference of small stains with an outer diameter of 79mm. In 2018, our group [20] proposed a robust displacement measurement algorithm based on quadratic function fitting, which achieved a measurement accuracy of 12.85" and demonstrated resistance to slight stains on a 38-mm-diameter grating.…”

Section: Introductionmentioning

confidence: 99%

Stain-Detection and Anti-Stain Algorithms Based on Dual Detector Data Interchange in Image-Type Displacement Measurement Technology

Wan

Zhao

2023

IEEE Trans. Instrum. Meas.

View full text Add to dashboard Cite

Displacement measurement technology based on image recognition algorithms represents a novel high-performance technique. In such measurements, when there are stains contaminating the measuring light path, it causes recognition errors from the linear array image sensor on the grating, resulting in inaccurate measurement results. Therefore, this report proposes stain-detection and anti-stain algorithms based on image recognition. The principle of image-type displacement measurement technology is described, and the influence of stains on the displacement measurements is analyzed according to four criteria in order to judge whether there are stains present. Then, an anti-stain algorithm based on the data exchange of dual-image sensors is proposed. Finally, experimental verifications are carried out. The experimental results show that the proposed algorithm effectively identifies the errors in the displacement measurements, when the experimental device is contaminated, the developed algorithms can accurately self-correct for the stain's interference. The results presented herein provide a theoretical basis for developing highly-reliable displacement measurement devices.

show abstract

“…The smaller the signal period, and the higher the quality of the gratings and scanning technologies, the smaller the SDE. To reduce the optical encoders’ SDE, multiple subdivision algorithms [ 17 , 18 , 19 , 20 ] have been proposed, many commercial integrated circuits [ 21 ] have been developed, and numerous gratings with special shapes [ 22 , 23 , 24 ] and devices with special dimensions [ 25 , 26 ] have been applied. Recently, the error compensation models based on particle swarm optimization have been applied to the optical encoders to compensate the SDE [ 27 , 28 , 29 ].…”

Section: Introductionmentioning

confidence: 99%

Methods for Reducing Subdivision Error within One Signal Period of Single-Field Scanning Absolute Linear Encoder

Yang

Kilikevičius

et al. 2023

Sensors

View full text Add to dashboard Cite

Optical encoders are widely used in accurate displacement measurement and motion-control technologies. Based on different measurement methods, optical encoders can be divided into absolute and incremental optical encoders. Absolute linear encoders are commonly used in advanced computer numerical control (CNC) machines. The subdivision error within one signal period (SDE) of the absolute linear encoder is vital to the positioning accuracy and low velocity control of CNC machines. In our paper, we study the working principle of the absolute linear encoder. We proposed two methods for reducing the SDE of the absolute linear encoder, a single-field scanning method based on the shutter-shaped Moiré fringe, as well as a method for suppressing harmonics through a phase shift of index grating. We established a SDE measuring device to determine the absolute linear encoder’s SDE, which we measured using a constant-speed approach. With our proposed methods, the SDE was reduced from ±0.218 μm to ±0.135 μm, which is a decrease of 38.07%. Our fast Fourier transformation (FFT) analysis of the collected Moiré fringe signals demonstrated that the third-, fifth-, and seventh-order harmonics were effectively suppressed.

show abstract

An anti-spot, high-precision subdivision algorithm for linear CCD based single-track absolute encoder

Cited by 20 publications

References 19 publications

Measurement and determination of encoder disc surface parameters in x-z planes using a conventional optical disc reading head

Measurement and determination of encoder disc surface parameters in x-z planes using a conventional optical disc reading head

Stain-Detection and Anti-Stain Algorithms Based on Dual Detector Data Interchange in Image-Type Displacement Measurement Technology

Methods for Reducing Subdivision Error within One Signal Period of Single-Field Scanning Absolute Linear Encoder

Contact Info

Product

Resources

About