An application of polarized domains in ferroelectric thin films using scanning probe microscope

Shin, Hyunjung; Lee, Kyung-Mee; Moon, Wonkyu; Jeon, Jong Up; Lim, Geunbae; Pak, Youngshang; Park, Jeong Hwan; Yoon, Ki Hyun

doi:10.1109/58.852061

Cited by 21 publications

(4 citation statements)

References 36 publications

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“…In 2000, Shin et al at KAIST experimented with AFM data storage on sol-gel deposited PZT. Bits were written at 14 V. Data were read back by measuring electric forces either in non-contact or contact mode [171]. Dot diameters on the order of 60-100 nm were written.…”

Section: Ferroelectric Mediamentioning

confidence: 99%

Probe Storage

Gemelli

Abelmann

Engelen

et al. 2010

Memory Mass Storage

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This chapter gives an overview of probe-based data storage research over the last three decades, encompassing all aspects of a probe recording system. Following the division found in all mechanically addressed storage systems, the different subsystems (media, read/write heads, positioning, data channel, and file system) will be discussed. In the media subsection various recording media will be treated, such as polymer based, phase change, ferroelectric and magnetic. In the probe array subsection various generations of thermal probes will be discussed, as well as examples of alternative write probes using currents, electric or magnetic fields, and different principles for data detection. Special attention is paid to parallel readout of probe arrays. In the positioning section, examples will be shown of electric and magnetic scanners, either precision engineered or realized by micromachining technologies, or combinations thereof. In the systems subsection the data channel will be discussed, including the read/write electronics circuitry, data detection, and coding algorithms. Special attention is paid to the writing strategy and considerations for probe-based storage file systems.

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Section: Ferroelectric Mediamentioning

confidence: 99%

Probe Storage

Gemelli

Abelmann

Engelen

et al. 2010

Memory Mass Storage

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“…ultrahigh areal density. Many approaches using probe-based techniques have been brought forward (Cooper et al 1999, Vettiger et al 1999, Shin et al 2000, Bhushan and Kwak 2007a, Kwak and Bhushan 2008. Various recording techniques using thermomechanical (Mamin andRugar 1992, Vettiger et al 1999), phase change (Kado and Tohda 1995, Gidon et al 2004, Wright et al 2006, magnetic (Ohkubo et al 1991), thermomagnetic (Nakamura et al 1995, Zhang et al 2002, optical (Betzig et al 1992), electrical (Barrett and Quate 1991) and ferroelectric (Franke et al 1994, Ahn et al 1997 methods have been demonstrated.…”

Section: Introductionmentioning

confidence: 99%

Nanotribology and nanomechanics of AFM probe-based data recording technology

Bhushan¹,

Kwak

Palacio

2008

J. Phys.: Condens. Matter

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With the advent of scanning probe microscopes, probe-based data recording technologies are being developed for ultrahigh areal density recording, where the probe tip is expected to be scanned at velocities up to 100 mm s −1. In one technique, a conductive atomic force microscope (AFM) tip is scanned over a phase change chalcogenide medium and phase change is accomplished by applying either a high or low magnitude of current which heats the interface. Another technique is ferroelectric data storage, where a conducting AFM tip is scanned over a lead zirconate titanate (PZT) film, a ferroelectric material. Ferroelectric domains can be polarized by applying short voltage pulses between the AFM tip and the bottom electrode layer that exceed the coercive field of the PZT film, resulting in nonvolatile changes in the electronic properties. Tip wear is a serious concern in both data storage methods. The understanding and improvement of tip wear, particularly at the high velocities needed and at high interface temperatures for high data rate recording, is critical to the commercialization of these data storage technologies. This paper presents a review of nanotribological and nanomechanical studies on the materials used in phase change and ferroelectric probe-based recording. Although this work is aimed at probe-based data recording, it is also relevant to the development of robust AFM probes and to the study of nanocontacts in general.

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“…With the advent of scanning probe microscopes (SPM), probe-based recording technologies are being developed for ultra-high areal density. Many approaches using probe-based techniques have been brought forward (Cooper et al 1999, Shin et al 2000, Bhushan 2007). Various recording techniques using thermomechanical (Mamin andRugar 1992, Vettiger et al 1999), phase change (Kado and Tohda 1995, Gidon et al 2004, Wright et al 2006, magnetic (Ohkubo et al 1991), thermomagnetic (Nakamura et al 1995, Zhang et al 2002, optical (Betzig et al 1992), electrical (Barrett and Quate 1991) and ferroelectric (Franke et al 1994, Ahn et al 1997 methods have been demonstrated.…”

Section: Introductionmentioning

confidence: 99%

Noble metal-coated probes sliding at up to 100 mm s⁻¹against PZT films for AFM probe-based ferroelectric recording technology

Bhushan

Kwak²

2008

J. Phys.: Condens. Matter

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With the advent of scanning probe microscopes, probe-based data recording technologies are being developed for ultra-high areal density. In the ferroelectric data storage being explored, a conductive atomic force microscope (AFM) tip is scanned over a lead zirconate titanate (PZT) film, which is a ferroelectric material. Ferroelectric domains can be polarized by applying short voltage pulses between the AFM tip and the bottom electrode layer that exceed the coercive field of the PZT film, resulting in nonvolatile changes in the electronic properties. A crucial reliability concern is the wear of the AFM tip and PZT film. The understanding and improvement of tip wear, particularly at the high velocities needed for high-data-rate recording, is critical to the commercialization of ferroelectric data storage. To this end, wear experiments are performed using various noble metal-coated tips sliding against a PZT film at velocities of 10 and 100 mm s−1. The noble metals that were used were Pt, Au–Ni, Pt–Ir and Pt–Ni. High sliding velocities are achieved by using a custom calibrated piezo stage in a commercial AFM. The Au–Ni and Pt–Ir tips are shown to exhibit the lowest wear. The tip wear mechanism is found to be primarily adhesive and abrasive wear, with some evidence of impact wear. The coefficient of friction increases during wear. This study advances the understanding of the physics of friction and wear of noble metal-coated AFM probes.

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An application of polarized domains in ferroelectric thin films using scanning probe microscope

Cited by 21 publications

References 36 publications

Probe Storage

Probe Storage

Nanotribology and nanomechanics of AFM probe-based data recording technology

Noble metal-coated probes sliding at up to 100 mm s⁻¹against PZT films for AFM probe-based ferroelectric recording technology

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An application of polarized domains in ferroelectric thin films using scanning probe microscope

Cited by 21 publications

References 36 publications

Probe Storage

Probe Storage

Nanotribology and nanomechanics of AFM probe-based data recording technology

Noble metal-coated probes sliding at up to 100 mm s−1against PZT films for AFM probe-based ferroelectric recording technology

Contact Info

Product

Resources

About

Noble metal-coated probes sliding at up to 100 mm s⁻¹against PZT films for AFM probe-based ferroelectric recording technology