An Application of X-ray Fluorescence Spectrometry to the Study of Thin-Layer Chromatography

Abstract

The combination of thin-layer chromatography (TLC) with X-ray fluorescence spectrometry (XRF) has been accomplished without any interfaces. It enables the direct, nondestructive visualization of elements developed on a TLC plate. In addition to inorganic compounds, organic compounds including electronegative elements can be detected simultaneously that cannot always be measured satisfactorily by competitive techniques; e.g., phenolic compounds containing chlorine, bromine, or iodine were distinctly detected by individual elemental imaging. The background of commercially available TLC plates with various thicknesses of the stationary phase and an outline of element detection limits were also investigated. TLC/XRF was found suitable for in situ TLC imaging of elements.

Detection of time‐resolved photoionization currents from pesticide‐contaminated vegetation

“…Nondestructive in situ analysis of pesticides has also been achieved by merging TLC with XRF (X-ray fluorescence spectrometry). 16 Sensitive detection of methoxychlor (i.e., a DDT derivative) has been recently achieved, while employing its selective complexation with a strongly fluorescing dye and its effect upon its fluorescence. 17 Here, we report the first experimental attempt of direct surface probing of pesticide-contaminated vegetation by means of laser-induced multiphoton-ionization (MPI).…”

Industrial analysis: metals, chemicals and advanced materials

“…The technique has been used to measure transition metals, halogens, phosphorus and sulfur in amino acid and nucleotide sample spots on thin-layer chromatography (TLC) plates. 116 Sections of the TLC plates were analysed directly without further pretreatment.…”