2014
DOI: 10.1016/j.jcss.2013.05.002
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An approach for lifetime reliability analysis using theorem proving

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Cited by 11 publications
(13 citation statements)
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“…The approach relies upon specifying the behaviors of analog components (such as transistors) by conservative approximation techniques based on piecewise-linear predicates on voltages and currents. Theorem proving was initially used to check for the implication relation between the implementation and the specification [19] [20]. In order to automate the verification process, the author proposed afterwards using constraint based techniques instead [21].…”
Section: Related Work Of Proof Based and Symbolic Methodsmentioning
confidence: 99%
“…The approach relies upon specifying the behaviors of analog components (such as transistors) by conservative approximation techniques based on piecewise-linear predicates on voltages and currents. Theorem proving was initially used to check for the implication relation between the implementation and the specification [19] [20]. In order to automate the verification process, the author proposed afterwards using constraint based techniques instead [21].…”
Section: Related Work Of Proof Based and Symbolic Methodsmentioning
confidence: 99%
“…A number of higher-order-logic formalizations of probability theory are available in higher-order logic (e.g., [72,73,74]) and have been utilized to verify sampling algorithms of a number of commonly used discrete [72] and continuous random variables [75] based on their probabilistic and statistical properties [76,77]. Moreover, this formalization has been used to conduct the reliability analysis of a number of applications, such as memory arrays [78], soft errors [79], electronic components [80] and oil and gas pipelines [81].…”
Section: Higher-order-logic Theorem Provingmentioning
confidence: 99%
“…This paper is designed to show the test of Reliability on the "Model for reducing weight and load on Production server database" [5] using 3P-Weibull distribution method. We compute Probability of Failure, BX% Life, Mean Life MTTF Impact Factor ISRA (India) = 1.344 Impact Factor ISI (Dubai, UAE) = 0.829 based on International Citation Report (ICR) Impact Factor GIF (Australia) = 0.356 Impact Factor JIF = 1.500 Impact Factor SIS (USA) = 0.912 Impact Factor РИНЦ (Russia) = 0.179 Impact Factor ESJI (KZ) = 1.042 ISPC Education & Innovation, Avignon, France 62 [2] and Failure Rate by using Weibull++ software's 3P-Weibull distribution method for the reliability.…”
Section: Objectivementioning
confidence: 99%
“…Average time, the units in the collected data are expected to operate before failure. It is often referred to as mean time to failure (MTTF) or mean time between failures (MTBF) [2]. As it is made known in Table 1, that we have estimate MTTF =735.254298, on the "model for reducing weight and load on production server database" [5].…”
Section: Mean Life Mttfmentioning
confidence: 99%
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