2012
DOI: 10.1039/c2jm33584k
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An aqueous solution process and subsequent UV treatment for highly transparent conductive ZnO films

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Cited by 37 publications
(36 citation statements)
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“…2 demonstrates a decrease of the DLS peak intensity from the ND to the 2 week aged and the dried sample. This feature is understood as a result of organic species 14 , defect complexes 17 due to water 15 , or OH groups 13 loosely bound to the NR surface introduced during CBD. These defect species can act as shallow donors, are easily removed after UV exposure 14 , and create a ±10 nm shift in the DLS PL spectrum.…”
mentioning
confidence: 99%
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“…2 demonstrates a decrease of the DLS peak intensity from the ND to the 2 week aged and the dried sample. This feature is understood as a result of organic species 14 , defect complexes 17 due to water 15 , or OH groups 13 loosely bound to the NR surface introduced during CBD. These defect species can act as shallow donors, are easily removed after UV exposure 14 , and create a ±10 nm shift in the DLS PL spectrum.…”
mentioning
confidence: 99%
“…This feature is understood as a result of organic species 14 , defect complexes 17 due to water 15 , or OH groups 13 loosely bound to the NR surface introduced during CBD. These defect species can act as shallow donors, are easily removed after UV exposure 14 , and create a ±10 nm shift in the DLS PL spectrum. Therefore, we conclude that drying the sample removes these defect species from the surface lowering, but stabilizing, the PL intensity.…”
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confidence: 99%
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“…15 First, generation of hydrogen and carbon species can be expected by photodecomposition of organic substances, being assumed to play a shallow-donor role. [19][20][21][22] As a result, some electrons were generated, resulting in increased carrier concentration.…”
Section: Al-doped Zno Film With Citrate Ionsmentioning
confidence: 99%
“…23,24 The increased optical bandgap energy is related to the increase of the carrier concentration by UV irradiation, as explained by the Burstein-Moss effect. 19,[25][26][27] Another reason for the decreased resistivity is the Al-ion doping. The amount of Al in the as-deposited film was evaluated by ICPS, confirming the presence of 1.5 ppm Al in the as-deposited film.…”
Section: Al-doped Zno Film With Citrate Ionsmentioning
confidence: 99%