An Automatic Testing System Design for Accelerometer Based on LabVIEW

Abstract

By analyzing the test method named orthogonal 12 points for accelerometer, there are several problems to be solved in the temperature experiments for accelerometer. In order to study the temperature characteristics of the accelerometer for better, the testing system for accelerometer based on Labview is designed and the composition of the system is introduced. The microprocessor used in the temperature experiment is C8052F series microcontrollers. A 24-bit A/D converter is embedded in the microprocessor and the resolution of 0.149 microvolts can meet the accuracy requirements of the accelerometer. According to the requirements of high accuracy and test efficiency for accelerometer, the digital multi-channel testing technology is applied to realize the accurate test. The application in temperature experiments indicates that this precise and steady testing system can meet the requirement of accelerometer calibrating & testing completely.