2024
DOI: 10.1088/1742-6596/2857/1/012006
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An Effect of Al on the Properties of ZnIn2Se4 Thin Film

Husham Kamil Mahmood,
Bushra H. Hussein

Abstract: Zinc-indium-selenide ZnIn2Se4 (ZIS) ternary chalcopyrite thin film on glass with a 500 nm thickness was fabricated by using the thermal evaporation system with a pressure of approximately 2.5×10−5 mbar and a deposition rate of 12 Å/s. The effect of aluminum (Al) doping with 0.02 and 0.04 ratios on the structural and optical properties of film was examined. The utilization of X-ray diffraction (XRD) was employed to showcase the influence of aluminum doping on structural properties. XRD shows that thin ZIS-pure,… Show more

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