An efficient Bayesian yield estimation method for high dimensional and high sigma SRAM circuits

Zhai, Jinyuan; Yan, Changhao; Wang, Sheng-Guo; Zhou, Dian

doi:10.1145/3195970.3195987

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

An efficient Bayesian yield estimation method for high dimensional and high sigma SRAM circuits

Cited by 4 publications

References 14 publications

An Efficient and Robust Yield Optimization Method for High-dimensional SRAM Circuits

An Efficient and Robust Yield Optimization Method for High-dimensional SRAM Circuits

Bayesian Optimized Mixture Importance Sampling for High-Sigma Failure Rate Estimation

Fast and Efficient High-Sigma Yield Analysis and Optimization Using Kernel Density Estimation on a Bayesian Optimized Failure Rate Model

Contact Info

Product

Resources

About