2018
DOI: 10.1007/s10470-018-1377-0
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An efficient feature extraction approach based on manifold learning for analogue circuits fault diagnosis

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Cited by 9 publications
(3 citation statements)
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“…Huahui Yang et al [14] applied convolutional neural networks in one dimension for diagnosing faults in analog circuits, aiming to simultaneously complete the tasks of extracting relevant features and classifying faults within the input signal through the neural network. Zhijie Yuan [15] used two popular methods in manifold learning methods, local linear embedding (LLE) and diffusion mapping (DM), to optimize the dimensionality reduction techniques commonly used, so as to better extract the fault features in analog circuits.…”
Section: Introductionmentioning
confidence: 99%
“…Huahui Yang et al [14] applied convolutional neural networks in one dimension for diagnosing faults in analog circuits, aiming to simultaneously complete the tasks of extracting relevant features and classifying faults within the input signal through the neural network. Zhijie Yuan [15] used two popular methods in manifold learning methods, local linear embedding (LLE) and diffusion mapping (DM), to optimize the dimensionality reduction techniques commonly used, so as to better extract the fault features in analog circuits.…”
Section: Introductionmentioning
confidence: 99%
“…Huahui Yang et al [13] applied one-dimensional convo-lutional neural networks to analog circuit fault diagnosis, aiming to simultaneously complete the tasks of feature extraction and fault classification of the input signal through the neural network. Zhijie Yuan [14] used two popular methods in manifold learning methods, local linear embedding (LLE) and diffusion mapping (DM), to optimize the dimensionality reduction techniques commonly used in analog circuit fault diagnosis, so as to better extract the fault features in analog circuits.…”
Section: Introductionmentioning
confidence: 99%
“…rough fault feature extraction, dimensions of fault feature can be reduced and redundancies of fault feature can be removed. It would be convenient to recognize fault category of analog circuit [14][15][16][17]. It is common to see that signal processing methods, information entropy methods, frequency analysis methods, and time-domain analysis methods are used to extract fault feature in analog circuit fault diagnosis [18].…”
Section: Introductionmentioning
confidence: 99%