An Electromechanical Impedance‐Based Imaging Algorithm for Damage Identification of Chemical Milling Stiffened Panel
Xie Jiang,
Wensong Zhou,
Xize Chen
et al.
Abstract:The multiple intersecting stiffeners on the chemical milling stiffened panel (CMSP) limit the application of active health monitoring methods on it. An imaging algorithm based on electromechanical impedance (EMI) and probability-weighting is proposed to achieve quantitative evaluation and localization of the damage on CMSP. The proposed algorithm compensates for the difference in sensor performance with coefficients and there is no need to determine the key parameters of the algorithm through prior experiments… Show more
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