An electronic speckle pattern interferometer for complete in-plane displacement measurement

Moore, Andrew J.; Tyrer, John R.

doi:10.1088/0957-0233/1/10/006

Cited by 102 publications

(27 citation statements)

References 7 publications

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“…Then each beam exiting the beam splitting cube should contain the shearing unit and own CCD camera. As explained in [16] a single viewing (imaging) optics should be used before the beam splitter to provide pixel by pixel correspondence of the same object points. Below we would like to present the principle of another approach to determine the surface slope of a specimen under test in the in-plane displacement detection configuration.…”

Section: Modified In-plane Espsi For Determining the Surface Strainmentioning

confidence: 99%

“…Note that all polarized light based systems, including the ones to measure two inplane interferograms at the same time [16], (twochannel system for registering shear type interferograms for orthogonal directions can be readily proposed along the lines presented in [16]) require the polarization state preserving surface ofthe object on reflection.…”

Section: Introductionmentioning

confidence: 99%

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Modified in-plane electronic speckle pattern shearing interferometry (ESPSI)

Patorski

Olszak²

1996

Laser Interferometry VIII: Techniques and Analysis

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Two optical methods for obtaining the partial derivatives of in-plane and out-of-plane displacement fields in the in-plane ESPSI configuration using temporal phase stepping for automatic analysis of fringe patterns are described. In the first method lateral shear interferograms of object image fields generated by individual symmetrical illuminating beams are recorded independently. The phases are calculated and their subtraction/addition gives required in-plane/out-of-plane displacement derivatives, respectively. Phase stepping is readily performed in the setup based on fiber optics and modulated laser diode illumination. In the second method two primary interferograms: a conventional in-plane displacement ESPI recording and one with object images mutually laterally displaced are recorded. Similarly, software subtraction or addition is performed to separate the out-of-plane displacement derivatives and double sensitivity in-plane displacement information.

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Section: Modified In-plane Espsi For Determining the Surface Strainmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Modified in-plane electronic speckle pattern shearing interferometry (ESPSI)

Patorski

Olszak²

1996

Laser Interferometry VIII: Techniques and Analysis

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show abstract

“…The principle of ESPI has been discussed extensively in other publications [1,2]; and used to measure two-dimensional displacements in event no dynamics [3,4] and dynamics [5,6]. In the interferometric speckle pattern the intensity of the light contains information on the optical phase and hence on the optical path length difference between the two paths through the interferometer.…”

Section: Introductionmentioning

confidence: 99%

“…Two fringe patterns corresponding to two components of the in-plane displacement were recorded simultaneously by two CCD cameras [5]; however, it is a little difficult to do so. Two fringe patterns corresponding to two components of the in-plane displacement were recorded simultaneously by two CCD cameras [5]; however, it is a little difficult to do so.…”

Section: Introductionmentioning

confidence: 99%

Uncertainty analysis using Monte Carlo method in the measurement of phase by ESPI

Morales¹,

Martı́nez²,

Rayas³

et al. 2008

AIP Conference Proceedings

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Articles you may be interested inContinual in-plane displacement measurement with temporal wavelet transform speckle pattern interferometry Rev. Sci. Instrum. 83, 015107 (2012); 10.1063/1.3675896 Displacement fields U and V by interferometry of three beams AIP Conf. Lateral force measurement using a probe fiber as a microlens J. Appl. Phys. 95, 5189 (2004); 10.1063/1.1691479Accounting for center-of-mass target motion using convolution methods in Monte Carlo-based dose calculations of the lung Med. Abstract.A method for simultaneously measuring whole field in-plane displacements by using optical fiber and based on the dual-beam illumination principle electronic speckle pattern interferometry (ESPI) is presented in this paper. A set of single mode optical fibers and beamsplitter are employed to split the laser beam into four beams of equal intensity. One pair of fibers is utilized to illuminate the sample in the horizontal plane so it is sensitive only to horizontal in-plane displacement. Another pair of optical fibers is set to be sensitive only to vertical in-plane displacement. Each pair of optical fibers differs in longitude to avoid unwanted interference. By means of a Fourier-transform method of fringepattern analysis (Takeda method), we can obtain the quantitative data of whole field displacements. We found the uncertainty associated with the phases by mean of Monte Carlo-based technique.

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“…Even though some DSPI systems based on polarization discrimination methods were developed for this purpose, 10,11 this approach has two drawbacks: (a) the test surface can appreciably depolarize the two orthogonalpolarized dual-beam illumination sets causing cross interference between them; (b) the optical setup becomes more bulky and complex. A step forward to solve these problems was recently given by Albertazzi et al 12 with the development of a novel double illumination DSPI system to measure radial in-plane displacements.…”

Section: Introductionmentioning

confidence: 99%

Residual stress measurement using a radial in-plane speckle interferometer and laser annealing: preliminary results

et al. 2003

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This paper presents a combined system based on digital speckle pattern interferometry and laser annealing to determine residual stresses in ductile materials. The system allows the measurement of the radial in-plane displacement field generated when a specimen subjected to residual stresses is locally heated. This novel approach for measuring residual stresses has the advantage of being nondestructive and can be easily applied to in situ tests. The description of the combined system is followed by the presentation of preliminary results which illustrate the ability of both techniques to identify residual stress fields and also to determine their principal directions.

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An electronic speckle pattern interferometer for complete in-plane displacement measurement

Cited by 102 publications

References 7 publications

Modified in-plane electronic speckle pattern shearing interferometry (ESPSI)

Modified in-plane electronic speckle pattern shearing interferometry (ESPSI)

Uncertainty analysis using Monte Carlo method in the measurement of phase by ESPI

Residual stress measurement using a radial in-plane speckle interferometer and laser annealing: preliminary results

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