2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP) 2017
DOI: 10.1109/ceidp.2017.8257503
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An enhanced operational definition of dielectric breakdown for DC voltage step-up tests

Abstract: Abstract-The imprecise definition of breakdown in the ASTM D3755-14 standard can misidentify breakdown. If the recommended test circuit current sensing element threshold is set too high, breakdown may occur undetected. Conversely, false positives may result from designating a low current threshold. An operational definition of breakdown much less sensitive to these pitfalls is outlined herein. This enhanced definition of breakdown is based on the average rate of change of the leakage current with increasing vo… Show more

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Cited by 2 publications
(1 citation statement)
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“…[9]. This method is adapted from the method recommended in spacecraft charging and ASTM standards, the details of which have been published previously [9][10][11][12][13]. In summary, leakage current is measured as voltage is applied across a dielectric thin-film sample; both transient partial discharges and total dielectric breakdown are observed.…”
Section: Proof Of Concept Methodsmentioning
confidence: 99%
“…[9]. This method is adapted from the method recommended in spacecraft charging and ASTM standards, the details of which have been published previously [9][10][11][12][13]. In summary, leakage current is measured as voltage is applied across a dielectric thin-film sample; both transient partial discharges and total dielectric breakdown are observed.…”
Section: Proof Of Concept Methodsmentioning
confidence: 99%