2001
DOI: 10.1088/0957-0233/12/5/312
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An ESPI system for determining in-plane deformations. Three-dimensional analysis of the carrier fringes and a proposal for analysis of transient in-plane deformations

Abstract: In this work we report results on analysis of in-plane deformation using the symmetrical illumination technique. A single illumination source is doubled by means of a mirror placed perpendicular to the object being tested. Carrier fringes are introduced by displacing the symmetrical sources (one of which is virtual), a technique often used in contouring. We present a three-dimensional theoretical model for the generation of the carrier fringes and analyse the basic concepts of this model. Experimental results … Show more

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Cited by 6 publications
(1 citation statement)
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“…However, the measurement is not continuously. For in-plane measurement of the displacement, speckle techniques and image processing will be used [6,7] . By image processing methods, the image sequence of rotating object is recorded by the use of stroboscopic light (illumination and camera triggered by each other) or by a high speed camera.…”
mentioning
confidence: 99%
“…However, the measurement is not continuously. For in-plane measurement of the displacement, speckle techniques and image processing will be used [6,7] . By image processing methods, the image sequence of rotating object is recorded by the use of stroboscopic light (illumination and camera triggered by each other) or by a high speed camera.…”
mentioning
confidence: 99%