A dynamic, process-based simulation model is used to evaluate the effect of injury by Sitobion avenae F. on yield of winter wheat at a range of attainable yield levels. The attainable yield is defined as the yield in the absence of pests and diseases, at the prevailing temperature and radiation and the available amount of soil nitrogen. Water limitation is not taken into account. Only the period from flowering to ripeness is considered. Aphid infestation intensity is expressed in aphid-days, the integral of aphid density (tiller-1 ) over time (day). The calculations show that damage per aphid-day decreases from flowering to ripeness because damage caused by honeydew decreases with advancing crop development stage while damage caused by aphid feeding is about constant. Damage per aphid-day during a particular period of crop development increases in a nearly linear fashion with the attainable yield level. At attainable yield levels over approximately 9000 kg ha -I and until crop development stage early milky ripe (DC 73), however, damage per aphid-day increases at a higher rate with the attainable yield level as compared to lower yield levels. The crop-physiological causes are discussed.Regression models are constructed that relate simulated aphid damage both during various periods of crop development and averaged over the entire post-anthesis phase, to the simulated attainable yield level. The accuracy of these simulation-based regression models and five published models of damage in winter wheat caused by S. avenae is evaluated using 21 data sets, obtained in experiments carried out between 1973 and 1984 in the Netherlands. Attention is focussed on two aspects of model accuracy: the agreement between predicted and measured damage and the size of the error in model predictions. In both aspects the simulation-based regression models are as good as the best published empirical models.