An experimental verification of a percolation model for RuO₂-glass thick resistive films

Abstract

We present the results of our experimental work concerning the sheet resistance, R,, temperature characteristics of resistance and relative power spectral density of l/f noise, S. versus the volume fraction ofwnductingmmponent , U , for RuOrglassmmposites.We eliminate the contributions of motact-film-resistive-~m interfaces to the measured characteristics. We find that the composites investigated can be mapped onto the threecomponent 3Drandomresistornetworl; (RRN) formedfrom wellconductingmetallic bonds, poorlyconductingmetal-insulator-meial (MIM) bondsand thosenotconducting. We provide the physical interpretation 01 the network's parameters: h,. h,, b , , i.e. the ratio of con. ductances of poorly and well conducting bonds, the ratio of their l/f noise relative power spectral densities and the fraction of metallic bonds in the set of all conducting bonds, respectively. The electrical transport characteristics of RuOrglass thick resistive films are interpreted with the help of bicritical behaviour of such a percolation network. We find qualitative agreement between S(R,) experimental data for a certain region of U and that from 3D RRN computer simulations using the Monte Carlo real space renormalization group algorithm.

Electrical Conductivity of RuO2–Borosilicate Glasses: Effect of the Synthesis Route

“…Despite their technical importance in many processes, electrical transport mechanisms in glass containing RuO 2 particles have still not been fully elucidated. In the area of microelectronic components, electrical transport in high lead glasses containing RuO 2 , known as thick‐film resistors (TFR), has been widely investigated 5–17 . In the nuclear field, the properties of the fission by‐product RuO 2 in glass melts have been investigated because of its specific electrical properties during vitrification processes 4,18,19 .…”

“…In the area of microelectronic components, electrical transport in high lead glasses containing RuO 2 , known as thick-film resistors (TFR), has been widely investigated. [5][6][7][8][9][10][11][12][13][14][15][16][17] In the nuclear field, the properties of the fission by-product RuO 2 in glass melts have been investigated because of its specific electrical properties during vitrification processes. 4,18,19 Recent studies have been carried out in order to point out mixed ionic and electronic conduction in these heterogeneous materials, from a molten state to a glassy state.…”

Tunneling-percolation origin of nonuniversality: Theory and experiments

“…This is illustrated in Fig. 1, where we have collected 99 different values of the critical exponent t and the critical threshold x c measured in various composites including carbon-black-polymer systems, oxide-based thick film resistors ͑TFRs͒, [27][28][29][30][31][32][33][34][35][36][37][38] and other metal-inorganic and -organic insulator composites. 26,[39][40][41][42][43][44][45][46][47][48] It is clear that, despite that many of the t-values reported in Fig.…”

1/f noise of the Rox™ sensor

“…In the case of RuO 2 thick film resistors it was shown that PdAg contacts strongly modify the interfacial region due to Ag migration from the contacts to the resistive layer. This migration leads to the changes in electrical properties of the interface, namely increase of its resistivity and 1/f noise intensity [11][12][13]. No such effects have been observed for Ag-free contacts.…”