2004
DOI: 10.1021/ac035149i
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An Expert System for Chemical Speciation of Individual Particles Using Low-Z Particle Electron Probe X-ray Microanalysis Data

Abstract: An electron probe X-ray microanalysis (EPMA) technique, using an energy-dispersive X-ray detector with an ultrathin window, designated a low-Z particle EPMA, has been developed. The low-Z particle EPMA allows the quantitative determination of concentrations of low-Z elements, such as C, N, and O, as well as chemical elements that can be analyzed by conventional energy-dispersive EPMA, in individual particles. Since a data set is usually composed of data for several thousands of particles in order to make envir… Show more

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Cited by 61 publications
(56 citation statements)
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“…A Monte Carlo calculation combined with reverse successive approximations was applied to determine the particles' elemental concentrations on the basis of the X-ray intensities (Ro et al, 2003). For standard particles, the quantification procedure provided results accurate within 12% relative deviations between the calculated and nominal elemental concentrations, except for C and K where the characteristic X-rays overlap with those from the Ag substrate (Ro et al, 2001b).…”
Section: Discussionmentioning
confidence: 99%
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“…A Monte Carlo calculation combined with reverse successive approximations was applied to determine the particles' elemental concentrations on the basis of the X-ray intensities (Ro et al, 2003). For standard particles, the quantification procedure provided results accurate within 12% relative deviations between the calculated and nominal elemental concentrations, except for C and K where the characteristic X-rays overlap with those from the Ag substrate (Ro et al, 2001b).…”
Section: Discussionmentioning
confidence: 99%
“…For standard particles, the quantification procedure provided results accurate within 12% relative deviations between the calculated and nominal elemental concentrations, except for C and K where the characteristic X-rays overlap with those from the Ag substrate (Ro et al, 2001b). The formula concentrations and the group distributions were rapidly and reliably determined by the "expert system" program (Ro et al, 2004).…”
Section: Discussionmentioning
confidence: 99%
“…The particle equivalent diameters were estimated from their projected area, assuming the particles to be spherical. The methods for acquiring the net X-ray intensities of the elements; for simulating the measured X-ray intensities for all chemical elements, in a particle by Monte Carlo calculations; and for using the "expert system" program to perform chemical speciation and determine the particle group distributions are described elsewhere (Vekemans et al, 1994;Ro et al, 2003Ro et al, , 2004. The elemental quantification procedure provided results with an accuracy of within 12 % relative deviations between the calculated and nominal elemental concentrations for various standard particles (Ro et al, 2000(Ro et al, , 2001.…”
Section: Measurement and Analysismentioning
confidence: 99%
“…Electron microscopy with energy dispersive X-ray (EDX) microanalysis or electron energy loss spectroscopy (EELS) yields spatially resolved chemical composition of individual particles Katrinak et al, 1992). One general limitation of EDX is that quantitative analysis of low-Z elements (carbon, nitrogen, and oxygen) is not always possible and requires time-intensive Monte-Carlo calculations (Ro et al, 2003(Ro et al, , 2004. TEM imaging with EELS can be used to characterize carbon content of particles, but its limited energy resolution precludes detailed analysis of carbon bonding (Katrinak et al, 1992).…”
Section: R C Moffet Et Al: Microscopic Characterization Of Carbonamentioning
confidence: 99%