2024
DOI: 10.1039/d4tc01262c
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An in situ study on the depth-resolved chemical states of undoped SrTiO3(001) surfaces during Ar+ sputtering and annealing processes with XPS

Dongwoo Kim,
Hojoon Lim,
Minsik Seo
et al.

Abstract: With the synchrotron-based depth-resolved XPS measurements, the modification of surface chemical states and the behavior of various impurities on undoped SrTiO3(001) surfaces are investigated. During Ar+ sputtering process, both the...

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