1997
DOI: 10.1002/adma.19970090308
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An improved experimental determination of external photoluminescence quantum efficiency

Abstract: Measurements of the photoluminescence (PL) quantum yield of high refractive index samples, such as thin films of polymeric semiconductors, are problematic owing to difficulties in determining the angular distribution of the emission, reflectivity, and absorbance. In the context of conjugated polymers, there is great interest in establishing the absolute quantum efficiency for PL as this is considered to determine the limits to the efficiency of electroluminescent diodes. A quantitative measurement of external … Show more

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Cited by 1,887 publications
(1,510 citation statements)
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“…The solid-state photoluminescence quantum yields in thin films were obtained with this integrating sphere, using the method outlined by de Mello et al [27] and applied by Palsson and Monkman [28] to polypyridine films using a set-up similar to the used in this work.…”
Section: Spectroscopic Measurementsmentioning
confidence: 99%
“…The solid-state photoluminescence quantum yields in thin films were obtained with this integrating sphere, using the method outlined by de Mello et al [27] and applied by Palsson and Monkman [28] to polypyridine films using a set-up similar to the used in this work.…”
Section: Spectroscopic Measurementsmentioning
confidence: 99%
“…PL spectra and efficiencies were measured at room temperature in a nitrogen-purged integrating sphere with excitation from an argon ion laser at 488 nm and detection with an Oriel Instaspec IV spectrometer. PL efficiencies were calculated as described by de Mello et al [30]. Time-correlated single photon counting (TCPSC) data were obtained using a 470-nm diode laser (PicoQuant LDH 400) with an 80-ps full width at half maximum at a 10 MHz repetition rate.…”
mentioning
confidence: 99%
“…The quantum yields in solution were determined against the standard POPOP [1,4-bis(5-phenyloxazol-2-yl)benzene, Ί = 0.93], while quantum yields of the thin films were determined with the integration-sphere setup according to the Mello method. [76] The emission of a thin film was measured in the integration sphere with excitation at 290 nm. The sample was placed in the centre of the sphere where direct excitation takes place for the first measurement (index: X_in).…”
Section: Methodsmentioning
confidence: 99%