2007 International Workshop on Physics of Semiconductor Devices 2007
DOI: 10.1109/iwpsd.2007.4472639
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An improvement of the breakdown voltage characteristic of trench gate IGBTs by using a shielding layer

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Cited by 3 publications
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“…The voltage handling capability of IGBT structure is given by the breakdown voltage (V B ) of the P-body/N−junction, that is strongly dependent on the thickness (W epi ) and the doping of the epitaxial layer (N epi ) [5] . According to equation (1) and (2), the optimal parameters are calculated: the n-base doping concentration is 3.05×10 13 cm -3 , the thickness is about 101.7μm.…”
Section: Design Of N-drift Regionmentioning
confidence: 99%
“…The voltage handling capability of IGBT structure is given by the breakdown voltage (V B ) of the P-body/N−junction, that is strongly dependent on the thickness (W epi ) and the doping of the epitaxial layer (N epi ) [5] . According to equation (1) and (2), the optimal parameters are calculated: the n-base doping concentration is 3.05×10 13 cm -3 , the thickness is about 101.7μm.…”
Section: Design Of N-drift Regionmentioning
confidence: 99%