An Incremental Aging Analysis Method Based on Delta Circuit Simulation Technique

He, Si-Rong; Qui, Nguyen Cao; Kuo, Yu‐Hsuan; Liu, Chien-Nan Jimmy

doi:10.1109/ats.2017.24

2017 IEEE 26th Asian Test Symposium (ATS) 2017

DOI: 10.1109/ats.2017.24

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An Incremental Aging Analysis Method Based on Delta Circuit Simulation Technique

Si-Rong He

Nguyen Cao Qui

Yu‐Hsuan Kuo

et al.

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An Incremental Aging Analysis Method Based on Delta Circuit Simulation Technique

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References 11 publications

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