2001 International Symposium on Electron Devices for Microwave and Optoelectronic Applications. EDMO 2001 (Cat. No.01TH8567)
DOI: 10.1109/edmo.2001.974303
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An industrial 0.35 μm SiGe BiCMOS technology for 5 GHz WLAN featuring an improved selective epitaxial growth process

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“…The factors mentioned above have a severe negative impact on manufacturability and processing cost. The innovation brought in our technology is the use of a PECVD oxynitride layer instead of the nitride layer to allow a much higher deposition rate of the epitaxial layer 1 . This paper is describing the development, properties and implementation of the oxynitride into the HBT interpoly dielectric layer module of a SiGe BiCMOS technology.…”
Section: Introductionmentioning
confidence: 99%
“…The factors mentioned above have a severe negative impact on manufacturability and processing cost. The innovation brought in our technology is the use of a PECVD oxynitride layer instead of the nitride layer to allow a much higher deposition rate of the epitaxial layer 1 . This paper is describing the development, properties and implementation of the oxynitride into the HBT interpoly dielectric layer module of a SiGe BiCMOS technology.…”
Section: Introductionmentioning
confidence: 99%