2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits 2015
DOI: 10.1109/ipfa.2015.7224458
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An initiative to develop a new approach for fracture characterization of silicon die crack

Abstract: A new approach for fracture characterization of a particular case study on silicon die crack is presented. It consists of four phases -visual inspection, molecular dynamics, finite element method and experiment. This work aims to use these techniques to investigate and provide a theoretical explanation and analysis of the physical failure modes and mechanisms involved, from the molecular to package level.

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