2016 International Conference on Advances in Computing, Communications and Informatics (ICACCI) 2016
DOI: 10.1109/icacci.2016.7732055
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An input test pattern for characterization of a full-adder and n-bit ripple carry adder

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Cited by 8 publications
(2 citation statements)
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“…On the other hand, the propagation delay of a FA is dependent on the previous input combination (A, B, C in ) and the current input combination (A, B, C in ). Hence, the power dissipation and critical path delay is measured for all possible 48 transitions, presented in [17]. The Power-Delay product (PDP) (measured in f J), Area-Power Product (APP) and the Area-Delay product (ADP) are calculated while considering each transistor as unit area.…”
Section: A Performance Of Fa As Single Cellmentioning
confidence: 99%
“…On the other hand, the propagation delay of a FA is dependent on the previous input combination (A, B, C in ) and the current input combination (A, B, C in ). Hence, the power dissipation and critical path delay is measured for all possible 48 transitions, presented in [17]. The Power-Delay product (PDP) (measured in f J), Area-Power Product (APP) and the Area-Delay product (ADP) are calculated while considering each transistor as unit area.…”
Section: A Performance Of Fa As Single Cellmentioning
confidence: 99%
“…The most critical element of the test is regarded as the carry'. A hybrid circuit that extends the spread of two bits is known as a half-adder, while one that extends the spread of three bits is known as a full-adder [18].…”
Section: Literature Reviewmentioning
confidence: 99%