1966
DOI: 10.1002/j.1538-7305.1966.tb04215.x
|View full text |Cite
|
Sign up to set email alerts
|

An Insertion Loss, Phase and Delay Measuring Set for Characterizing Transistors and Two-Port Networks Between 0.25 and 4.2 gc

Abstract: A new insertion loss, phase and delay measurement tool has been developed for characterizing gigacycle bandwidth transistors and general two‐port networks on a small signal basis over a frequency range from 0.25 to 4‐2 gc. Maximum inaccuracies are 0.1 db, 0.6 degree (over a 40‐db loss range), and 0.5 nanosecond (over a 20‐db loss range). Above 2.0 gc, the errors may double. The particular parameters selected for measurement are closely related to the scattering coefficients of the device under test, evaluated … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

1968
1968
1976
1976

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 6 publications
references
References 5 publications
0
0
0
Order By: Relevance