2024
DOI: 10.1063/5.0213738
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An instrumentation guide to measuring thermal conductivity using frequency domain thermoreflectance (FDTR)

Dylan J. Kirsch,
Joshua Martin,
Ronald Warzoha
et al.

Abstract: Frequency Domain Thermoreflectance (FDTR) is a versatile technique used to measure the thermal properties of thin films, multilayer stacks, and interfaces that govern the performance and thermal management in semiconductor microelectronics. Reliable thermal property measurements at these length scales (≈10 nm to ≈10 μm), where the physics of thermal transport and phonon scattering at interfaces both grow in complexity, are increasingly relevant as electronic components continue to shrink. While FDTR is a promi… Show more

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