2015
DOI: 10.1088/1748-0221/10/05/c05013
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An introduction to some imperfections of CCD sensors

Abstract: CCD sensors do not deliver a perfect image of the light they receive. Beyond the well known linear image smearing due to diffusion of charges during their drift towards the pixel wells, non-linear effects are at play in these sensors. We now have ample evidence for both a fluxdependent and static image distortions, especially but not only, on deep-depleted CCDs. For large surveys relying on CCD sensors, these effects should now be taken into account when reducing data. We present here a summary of current resu… Show more

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Cited by 6 publications
(4 citation statements)
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“…Other effects known or expected for thick CCDs, e.g., notable charge diffusion, resistivity variations in the bulk Si (a.k.a. 'tree-ring pattern', see, e.g., Astier 2015), or wavelength dependent defocus from the increased absorption depth of infrared photons, are not present in LDSS-3C.…”
Section: An Introduction To Ldss-3cmentioning
confidence: 94%
“…Other effects known or expected for thick CCDs, e.g., notable charge diffusion, resistivity variations in the bulk Si (a.k.a. 'tree-ring pattern', see, e.g., Astier 2015), or wavelength dependent defocus from the increased absorption depth of infrared photons, are not present in LDSS-3C.…”
Section: An Introduction To Ldss-3cmentioning
confidence: 94%
“…Thick, high-resistivity CCDs have been used by other widefield imagers such as the Dark Energy Camera (DECam, Flaugher et al 2015) and the Hyper Suprime-Cam (HSC, Miyazaki et al 2018), in part due to their high quantum efficiency (QE) at longer wavelengths (near-infrared). However, these types of detectors have been found to imprint subtle but significant undesirable characteristics that impact centroid, photometric, flux, and shape measurements (Stubbs 2014;Astier 2015;Mandelbaum 2015). Study and characterization of any source of systematic errors will be crucial to achieving the required accuracy to achieve the scientific goals of a survey such as the LSST.…”
Section: Introductionmentioning
confidence: 99%
“…(3) Astier certified static image distortions on deep-depleted CCD sensors and presented a summary of the results of CCD sensor characterization and mitigation methods. (4) Xia et al proposed that, compared with traditional industrial sensor signals, machine vision systems can quickly understand manufacturing scenarios and provide the extracted semantic information to manufacturing ontologies developed by experts or ML-enabled network systems. (5) Leary used machine vision technology to monitor the entire metal rolling process and realized visual feedback control of the entire system through a high-speed data transmission network.…”
Section: Introductionmentioning
confidence: 99%