2006
DOI: 10.1002/cvde.200500382
|View full text |Cite
|
Sign up to set email alerts
|

An MOCVD Approach to High‐k Praseodymium‐Based Films

Abstract: New high-k dielectric thin films have become of increasing interest over the last few years in the search for an alternative material to SiO 2 gate insulators in MOS devices. Lanthanide oxides have been studied as potential candidates for SiO 2 replacement. In this review, a description of the different CVD approaches to fabricating praseodymium oxide and silicate films with dielectric properties is presented. In particular, thermally activated and liquid-injection metal-organic (MO) CVD as well as atomic laye… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4

Citation Types

0
8
0

Year Published

2006
2006
2017
2017

Publication Types

Select...
9

Relationship

0
9

Authors

Journals

citations
Cited by 14 publications
(8 citation statements)
references
References 93 publications
(117 reference statements)
0
8
0
Order By: Relevance
“…The study of thin films of praseodymia has so far been limited to films on silicon substrates grown by physical vapor deposition (PVD) or chemical vapor deposition (CVD), mostly in the context of microelectronic applications. 14,18 To the best of our knowledge, only one study exists on praseodymia films grown on a Ru(0001) metal substrate, focusing on CO and C 2 H 4 adsorption on Rh loaded films. 19 However, in that particular study the praseodymia film was not crystalline and did not exhibit a diffraction pattern, rendering an atomistic interpretation of the role of the oxide virtually impossible.…”
Section: Introductionmentioning
confidence: 99%
“…The study of thin films of praseodymia has so far been limited to films on silicon substrates grown by physical vapor deposition (PVD) or chemical vapor deposition (CVD), mostly in the context of microelectronic applications. 14,18 To the best of our knowledge, only one study exists on praseodymia films grown on a Ru(0001) metal substrate, focusing on CO and C 2 H 4 adsorption on Rh loaded films. 19 However, in that particular study the praseodymia film was not crystalline and did not exhibit a diffraction pattern, rendering an atomistic interpretation of the role of the oxide virtually impossible.…”
Section: Introductionmentioning
confidence: 99%
“…Lanthanide precursors that do have sufficient volatility for CVD and ALD applications typically employ anionic ligands that either are sterically bulky, such as silylamides, or are multidentate (or polyhapto), such as β-diketonates, cyclopentadienyls, amidinates, and guanidinates. Neutral chelating donors (such as glymes) are often employed to fill remaining vacancies in the coordination sphere, sometimes by grafting them onto the anionic ligands. Examples of these ligand types include ether-functionalized β-ketoiminates , and alkoxides. Several reviews of lanthanide precursors and their use in CVD and ALD have been published. ,,,, …”
Section: Introductionmentioning
confidence: 99%
“…The development of improved lanthanide-containing precursors suitable for chemical vapor deposition (CVD) and atomic layer deposition (ALD) is a significant technological goal. Lanthanide materials have optical, electrical, and magnetic properties that make them useful in many applications such as phosphors in LEDs and lasers and as high-κ dielectrics for microelectronic transistors. Ideal CVD and ALD precursors are highly volatile and deposit films cleanly and conformally (i.e., with uniform thickness) in trenches and vias with high aspect ratios (>5:1)…”
mentioning
confidence: 99%