2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Workshops 2010
DOI: 10.1109/cvprw.2010.5543441
|View full text |Cite
|
Sign up to set email alerts
|

An MRF-based statistical deformation model for morphological image analysis

Abstract: As collections of 2D/3D images continue to grow, interest in effective ways to use the statistical morphological properties of a group of images to enhance biomedical image analysis has surged. During the last several years, advances in non-linear registration techniques have made possible the fast estimation of highly accurate deformation fields with dense feature correspondences between two images. Recently, statistical deformation models (SDMs) have emerged as effective methods to capture the statistical an… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 11 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?