2015 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3m-Nano) 2015
DOI: 10.1109/3m-nano.2015.7425511
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An on-line scanning time allocation based variable speed scanning method for atomic force microscopies

Xiuyan Ren
1
,
Yongchun Fang
2
,
Lu Han
3
et al.
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