Citation for published version (APA): Visscher, W. (1983). Ellipsometry of nickel-oxides and -hydroxides in alkaline electrolyte. Journal de Physique. Colloque, 44(C10), 213-216. DOI: 10.1051/jphyscol:19831044, 10 Please check the document version of this publication:• A submitted manuscript is the version of the article upon submission and before peer-review. There can be important differences between the submitted version and the official published version of record. People interested in the research are advised to contact the author for the final version of the publication, or visit the DOI to the publisher's website.• The final author version and the galley proof are versions of the publication after peer review.• The final published version features the final layout of the paper including the volume, issue and page numbers.
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AbstractThe growth and oxidation of thin Ni(OH)2 films deposited on Ni were investigated by ellipsometry. The refractive indices of a-Ni(OH)2.~-Ni(OH)2 and YZ-NiOOH were obtained at the wavelength 546.1 nm. Furthermore. the anodic oxidation of Ni in 0.1 M KOH was studied. The passive oxide layer is initially Nio.x HZO. Repeated anodic and cathodic potential cycling change the optical properties of this layer and leads to the growth of a low density oxide layer.