An RTL ATPG Flow Using the Gate Inherent Fault (GIF) Model Applied on Non-, Standard- and Random-Access-Scan (RAS)

Strauch, Tobias

doi:10.1109/dsd.2019.00018

2019 22nd Euromicro Conference on Digital System Design (DSD) 2019

DOI: 10.1109/dsd.2019.00018

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An RTL ATPG Flow Using the Gate Inherent Fault (GIF) Model Applied on Non-, Standard- and Random-Access-Scan (RAS)

Tobias Strauch¹

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An RTL ATPG Flow Using the Gate Inherent Fault (GIF) Model Applied on Non-, Standard- and Random-Access-Scan (RAS)

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References 33 publications

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