An SRAM-Based Radiation Monitor With Dynamic Voltage Control in 0.18-&lt;inline-formula&gt; 
                     &lt;tex-math notation="LaTeX"&gt;$\mu$ &lt;/tex-math&gt;
                  &lt;/inline-formula&gt;m CMOS Technology

Prinzie, Jeffrey; Thys, Sam; Bockel, Bjorn Van; Wang, Jialei; Smedt, Valentijn De; Leroux, Paul

doi:10.1109/tns.2018.2885693

Cited by 15 publications

(4 citation statements)

References 21 publications

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“…A low-cost alternative to diode-based detectors are the SRAM-based detectors. Due to high sensitivity of SRAM cells to particle strikes, a stand-alone SRAM chip can be used to measure the particle count rate in terms of the number of bit-flips [5,6], from which the particle flux can be determined. The advantages of SRAM detectors are simple operating principle and fully digital processing.…”

Section: Related Work and Paper Contributionmentioning

confidence: 99%

“…Note that the rise and fall time constants depend on the particle's strike location and angle of incidence. The collected charge Q (in pC) can be expressed in terms of effective charge collection length l (in μm) and particle LET through the relation (6). For this analysis we have chosen l = 2.1 μm, based on the results for 130 nm technology obtained from device simulations [22].…”

Section: Simulation Setupmentioning

confidence: 99%

“…Numerous solutions for soft error monitoring in space have been proposed. The most common sensors are PN/PIN diodes or photodiodes [3,4], stand-alone SRAMs [5,6], 3D NAND flash detectors [7], acoustic wave detectors [8], and bulk built-in current sensors (BBICS) [9][10][11][12][13]. We have proposed two alternative solutions: embedded SRAM [14] and custom-sized inverter chain [15,16].…”

Section: Introductionmentioning

confidence: 99%

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PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients

Andjelković

Marjanovic²,

Chen³

et al. 2022

Microelectronics Reliability

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Section: Related Work and Paper Contributionmentioning

confidence: 99%

Section: Simulation Setupmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients

Andjelković

Marjanovic²,

Chen³

et al. 2022

Microelectronics Reliability

View full text Add to dashboard Cite

“…As technologies have scaled down, single particle strikes can upset multiple cells simultaneously, depending on the particle energy. As indicated in [72], the ratio of MCU and SCU can be used to estimate the particle energy. The radiation detectors used in ESA [73], CERN [74] and satellite mission [75] have embedded multiple commercial off-the-shelf (COTS) SRAMs for SEU monitoring.…”

Section: Sram Based Radiation Monitormentioning

confidence: 99%

A Review of Semiconductor Based Ionising Radiation Sensors Used in Harsh Radiation Environments and Their Applications

et al. 2021

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This article provides a review of semiconductor based ionising radiation sensors to measure accumulated dose and detect individual strikes of ionising particles. The measurement of ionising radiation (γ-ray, X-ray, high energy UV-ray and heavy ions, etc.) is essential in several critical reliability applications such as medical, aviation, space missions and high energy physics experiments considering safety and quality assurance. In the last few decades, numerous techniques based on semiconductor devices such as diodes, metal-oxide-semiconductor field-effect transistors (MOSFETs) and solid-state photomultipliers (SSPMs), etc., have been reported to estimate the absorbed dose of radiation with sensitivity varying by several orders of magnitude from μGy to MGy. In addition, the mitigation of soft errors in integrated circuits essentially requires detection of charged particle induced transients and digital bit-flips in storage elements. Depending on the particle energies, flux and the application requirements, several sensing solutions such as diodes, static random access memory (SRAM) and NAND flash, etc., are reported in the literature. This article goes through the evolution of radiation dosimeters and particle detectors implemented using semiconductor technologies and summarises the features with emphasis on their underlying principles and applications. In addition, this article performs a comparison of the different methodologies while mentioning their advantages and limitations.

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Low-power electronic technologies for harsh radiation environments

et al. 2021

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Over the past decades, electronic technologies have evolved to serve a wide range of applications, with some necessitating their reliable operation in harsh radiation environments. This perspective article reviews the current landscape in rad-hard electronics, covering the scope of radiation environments, the application needs, the underlying phenomena that impose functional constraints as well as established design methodologies, relying on commercially available technologies (CMOS) for mitigating e↵ects that lead to failure. We further examine the potential of emerging memristive technologies in this field and their properties that render these rad-hard. We also review a variety of rad-hard device designs, rad-mitigation techniques, and experimental procedures for validating the performance of the most promising solutions. Finally, we conclude this article by presenting a roadmap on new concepts and application opportunities enabled by the introduction of novel technologies and designs that can reliably operate under such extreme conditions. topilot upsets that occur on average once in every 200 flight hours, notwithstanding, electrical upsets in automotive electronics and data centers. 3,7 In addition, the solar flares' intense particles and X-rays ionize and increase the density of the low layers of ionosphere, respectively, and interact with the electromagnetic waves resulting into disturbances in the high-frequency radio communication system by fading of the HF signal. 3 These problems eventually a↵ect the stability of the flight system, and tra c operations and navigations both in airspace and on the ground, where safety assurance is of primary importance. Similarly, the operation of nuclear facilities in a safety critical manner is of paramount importance and rad-hard technologies are commonly employed to enhance the overall safety margins. 8 Moreover, radiation e↵ects raise a concern in medical and industrial equipment where X-ray and are used for therapy and diagnostic purposes while in highenergy physics facilities, various particles and photons are generated by the collisions in particle accelerators which pose a severe challenge for the accelerator instrumentation and the radiation detection, data acquisition and communication in the embarked experiments. 9Nevertheless, rad-hard integrated circuit technologies often require additional processing and more complex configurations than the standard fabrication flow that makes the rad-hard electronics, particularly low-power electronic technologies, di cult to keep up with the International Technology Roadmap for Semiconductors (ITRS) guide. 10 This article examines the latest logic and memory design techniques for radiation e↵ect mitigation and presents future trends for rad-hard technologies.

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An SRAM-Based Radiation Monitor With Dynamic Voltage Control in 0.18-<inline-formula> <tex-math notation="LaTeX">$\mu$ </tex-math> </inline-formula>m CMOS Technology

Cited by 15 publications

References 21 publications

PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients

PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients

A Review of Semiconductor Based Ionising Radiation Sensors Used in Harsh Radiation Environments and Their Applications

Low-power electronic technologies for harsh radiation environments

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