Nonlinear light-matter interactions have emerged as a promising platform for various applications, including imaging, nanolasing, background-free sensing, etc. Subwavelength dielectric resonators offer unique opportunities for manipulating light at the nanoscale and miniturising optical elements. Here, we explore the resonantly enhanced four-wave mixing (FWM) process from individual silicon resonators and propose an innovative FWM-enabled infrared imaging technique that leverages the capabilities of these subwavelength resonators. Specifically, we designed high-Q silicon resonators hosting dual quasi-bound states in the continuum at both the input pump and signal beams, enabling efficient conversion of infrared light to visible radiation. Moreover, by employing a point-scanning imaging technique, we achieve infrared imaging conversion while minimising the dependence on high-power input sources. This combination of resonant enhancement and point-scanning imaging opens up new possibilities for nonlinear imaging using individual resonators and shows potential in advancing infrared imaging techniques for high-resolution imaging, sensing, and optical communications.