Analog/mixed-signal circuit design in nano CMOS era

Kobayashi, Haruo; Aoki, Hitoshi; Katoh, Kentaroh; Li, Congbing

doi:10.1587/elex.11.20142001

Cited by 14 publications

(3 citation statements)

References 20 publications

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“…RTL simulation and FPGA measurement results validated the effectiveness. We conclude this paper by remarking that our TDC design work used only RTL (without SPICE) simulation and FPGA (instead of full custom CMOS) implementation, which would be suitable for mixed-signal SoC design in nano-CMOS era (13) .…”

Section: Resultsmentioning

confidence: 99%

A Glitch-Free Time-to-Digital Converter Architecture Based on Gray Code

Kobayashi

2016

IEEJ Trans.EIS

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A glitch-free time-to-digital converter (TDC) based on Gray code is presented. This architecture can reduce hardware, power consumption, as well as chip area significantly compared to a flash type TDC, while keeping comparable performance and glitch-free characteristics. Its proof-of-concept prototype was implemented on FPGA, and the simulation and measurement results validate the effectiveness of the proposed architecture.

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Section: Resultsmentioning

confidence: 99%

A Glitch-Free Time-to-Digital Converter Architecture Based on Gray Code

Kobayashi

2016

IEEJ Trans.EIS

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“…It is also heavily dependent on researchers themselves. Here, the author's group own experiences are presented as well as their research motivations [1][2][3][4][5][6][7].…”

Section: Introductionmentioning

confidence: 99%

How the Author's Group Came Up with Ideas in Analog/Mixed-Signal Circuit and System Area

KOBAYASHI

2024

IEICE Trans. Fundamentals

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This article reviews the author's group research achievements in analog/mixed-signal circuit and system area with introduction of how they came up with the ideas. Analog/mixed-signal circuits and systems have to be designed as well-balanced in many aspects, and coming up ideas needs some experiences and discussions with researchers. It is also heavily dependent on researchers. Here, the author's group own experiences are presented as well as their research motivations.

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“…In recent years, thanks to the advancement of semiconductor manufacturing processes, the semiconductor fabrication cost per one transistor has decreased, while the test cost may increase if testing-related technologies were not improved; hence much attention is being paid to low cost and high quality testing technology [1].…”

Section: Introductionmentioning

confidence: 99%

Phase Noise Measurement and Testing with Delta-Sigma TDC

Osawa

Hirabayashi

Harigai

et al. 2015

KEM

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This paper describes a phase noise measurement and testing technique for a clock using a delta-sigma time-to-digital converter (TDC) and verifies its effectiveness with MATLAB simulations. The proposed technique can be implemented with relatively small circuitry, based on the following: (i) The clock under test (CUT) is a repetitive signal. (ii) The time resolution with CUT and a reference clock can be finer with longer measurement time with the delta-sigma TDC. (iii) The phase noise power spectrum can be calculated from the delta-sigma TDC output data using FFT. High performance spectrum analyzers with long measurement time (several ten seconds order due to average of several-time phase measurement results), which are very costly in mass production testing, are not be needed for phase noise measurement with the proposed technique. Our simulation used the input clock of 1 MHz in several phase fluctuation cases, and we observed that the phase fluctuation spectrum at the expected frequency from TDC output power spectrum obtained by FFT. We also investigated the amount of phase fluctuation with our theoretical calculation, which agrees with the simulation results.

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Analog/mixed-signal circuit design in nano CMOS era

Cited by 14 publications

References 20 publications

A Glitch-Free Time-to-Digital Converter Architecture Based on Gray Code

A Glitch-Free Time-to-Digital Converter Architecture Based on Gray Code

How the Author's Group Came Up with Ideas in Analog/Mixed-Signal Circuit and System Area

Phase Noise Measurement and Testing with Delta-Sigma TDC

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