Analyse quantitative d’echantillons minces

Tixier, R.; Philibert, J.

doi:10.1007/978-3-662-24778-5_27

Cited by 10 publications

(6 citation statements)

References 3 publications

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“…Clearly, there is a significant advantage in working with small thicknesses in order to minimize the effect of FSE on k A B factors and the effect of absorption. In this context, the critical thickness, t,, necessary to prevent absorption, calculated using the Tixier &Philibert (1969) criterion andHenke &Ebisu (1974) mass absorption coefficients, is equal to 6 nm for a B-95 wtyo Fe alloy, at which about 4.7% of the X-rays would be generated by FSE. Since it would be difficult to prepare a foil thinner than 6 nm, the effect of FSE should be included in the calculation of k A B factors, and the effect of B concentration on k* at 100 keV will be significant since practical thickness values range from 50 to 100 nm.…”

Section: R E S U L T S a N D Discussionmentioning

confidence: 99%

A Monte Carlo code to simulate the effect of fast secondary electrons on κ_AB factors and spatial resolution in the TEM

Gauvin

L’Éspérance

1992

Journal of Microscopy

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SUMMARY Fast secondary electrons (FSE), which result from inelastic scattering of incident electrons, are known to generate a significant number of X‐rays for light elements, and also to degrade the spatial resolution of X‐ray microanalysis in thin foils. A Monte Carlo program simulating the generation and diffusion of FSE in binary systems has been developed to study the effect of composition on κAB factors and spatial resolution. The effect of accelerating voltage and thickness is also presented.

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Section: R E S U L T S a N D Discussionmentioning

confidence: 99%

A Monte Carlo code to simulate the effect of fast secondary electrons on κ_AB factors and spatial resolution in the TEM

Gauvin

L’Éspérance

1992

Journal of Microscopy

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“…Based on the earlier work of Tixier and Philibert (1969) and Konig (1976), Goldstein et al (1977) derived an equation for the correction necessary to the k-factor when preferential absorption of x-rays takes place in a thin, parallel-sided foil:…”

Section: Methodsmentioning

confidence: 99%

Determination of experimental and theoretical k_ASi factors for a 200‐kV analytical electron microscope

Sheridan

1989

J. Elec. Microsc. Tech.

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The relative sensitivity of an analytical electron microscope and energy-dispersive x-ray detector to x-rays of various elements is investigated through an extensive kASi factor study. Elemental standards, primarily National Bureau of Standards multielement research glasses, were dry-ground into submicrometer-sized particles and analyzed at 200 kV accelerating potential. The effect of self-absorption of x-rays by the particle has been corrected for, allowing the experimental kASi factors from this study to approximate those that could be obtained from "infinitely thin" specimens. Whenever possible, elemental k-factors were determined by the analysis of many (up to a maximum of nine) different standard materials. Experimental kASi factors were calculated for a wide range of K alpha, L alpha, and M alpha x-ray lines. For comparison, theoretical kASi factors, employing a variety of ionization cross sections, were computed. Good agreement is obtained between several of the theoretical k-factor models and the experimental results. Mass volatilization of Na and K from the small glass particles during analysis is discussed, as are observations that the grinding and/or dispersing of standard materials in a liquid (such as ethanol) may promote leaching of certain elements from the particle matrix.

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“…formulae have been derived on a Russ (1974) Powell (1976b theoretical basis. Tixier and Philibert (1969) give the equation (9) ( $ ) t r is the mass absorption coefficient for the measured x-ray line of element A in the specimen, Q is the specimen density and a is the take-off angle. On the other hand, with reference to Goldstein et al (1977) SCANNING Vol.…”

Section: Critical Specimen Thicknessmentioning

confidence: 99%

Quantitative energy dispersive x‐ray micro‐analysis of thin metal specimens using the STEM

Schwaab

1987

Scanning

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This paper gives an outline of the present state of the quantitative energy dispersive x-ray micro-analysis according to the Cliff-Lorimer method in combination with the STEM. Spectrometer efficiency, line intensity fraction, fluorescence yield, ionization cross section and the critical specimen thickness are discussed in particular detail. The main emphasis in this context is placed on the transferability of data given in the literature to other equipment, and on the accuracy of equations for the calculation of the above mentioned parameters. Correction FactorsWhen an electron beam strikes matter, in addition to Bremsstrahlung, characteristic x-radiation is generated. According to equation (1) and contrary to the situation for bulk specimens, not only electron backscattering, but also absorption and fluorescence processes may be neglected for thin specimens (Philibert and Tixier 1975). The intensity I, of the x-ray line of an element A, measured using an energy dispersive detector, is described (e. g. Tixier 1975 and Junossy et al. 1979) by:

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Analyse quantitative d’echantillons minces

Cited by 10 publications

References 3 publications

A Monte Carlo code to simulate the effect of fast secondary electrons on κ_AB factors and spatial resolution in the TEM

A Monte Carlo code to simulate the effect of fast secondary electrons on κ_AB factors and spatial resolution in the TEM

Determination of experimental and theoretical k_ASi factors for a 200‐kV analytical electron microscope

Quantitative energy dispersive x‐ray micro‐analysis of thin metal specimens using the STEM

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Analyse quantitative d’echantillons minces

Cited by 10 publications

References 3 publications

A Monte Carlo code to simulate the effect of fast secondary electrons on κAB factors and spatial resolution in the TEM

A Monte Carlo code to simulate the effect of fast secondary electrons on κAB factors and spatial resolution in the TEM

Determination of experimental and theoretical kASi factors for a 200‐kV analytical electron microscope

Quantitative energy dispersive x‐ray micro‐analysis of thin metal specimens using the STEM

Contact Info

Product

Resources

About

A Monte Carlo code to simulate the effect of fast secondary electrons on κ_AB factors and spatial resolution in the TEM

A Monte Carlo code to simulate the effect of fast secondary electrons on κ_AB factors and spatial resolution in the TEM

Determination of experimental and theoretical k_ASi factors for a 200‐kV analytical electron microscope