1994
DOI: 10.1299/kikaia.60.1985
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Analyses of Delamination Arrest Effect of Dimples on Interface in LSI Package.

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“…Therefore, a reliable design for the molding resin and the bonded interface is required. When used as an example of the semi-conductor package, the flaking-off-strength evaluation technique of the bonded interface has been actively developed (1) - (3) , because flaking off on the joint field side about the lead frame and the molding resin causes the package to crack during the solder reflow.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, a reliable design for the molding resin and the bonded interface is required. When used as an example of the semi-conductor package, the flaking-off-strength evaluation technique of the bonded interface has been actively developed (1) - (3) , because flaking off on the joint field side about the lead frame and the molding resin causes the package to crack during the solder reflow.…”
Section: Introductionmentioning
confidence: 99%