2014
DOI: 10.1117/12.2071877
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Analyses of multiple surfaces transform interferometry in parallel plate measurement

Abstract: Multiple surfaces transform interferometery is a preferred technology for surface profile and index homogeneity measurement using a Fourier based analysis method combined with phase-shifting interferometer. As a four-surface cavity for example, the surface form and index inhomogeneity of the parallel plate are deduced by extracting the information from the corresponding interference frequency. The errors of surface form and index homogeneity are simultaneously simulated and analyzed with different sampling buc… Show more

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