Analysis and evaluation of measurement errors in Mueller matrix microscopy
Tongyu Huang,
Zheng Hu,
Hui Ma
Abstract:Mueller matrix microscopy can provide a comprehensive description of sample’s polarization properties non-invasively, and has shown attractive applications in many different fields such as biomedicine, marine particle monitoring, and material identification. Mueller matrix measurements are based on multiple light intensity measurements under illuminations of different polarization states, therefore have more error sources compared to other imaging methods, which reduce the image quality and hinder efforts for … Show more
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